International Test Conference and Test Week - Conference dedicated to electronic test technology, covering the complete cycle from design verification to failure analysis.

		Tuesday, 14 October, 2008
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International Test Conference and Test Week

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	Conference dedicated to electronic test technology, covering the complete cycle from design verification to failure analysis. Sponsored Links:
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Title:	International Test Conference
Description:	International Test Conference: world's premier conference dedicated to electronic test technology, including design verification, test, diagnosis, failure analysis, and design improvement.
Category:	Design - Analysis - Failure - Simulation - Test - Electronics - Integrated - Circuits - Diagnosis

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