Science Central - All about Science

Sunday, 22 November, 2009

search

for
Directories
 
Category:  Science » Methods and Techniques » Microscopy » Electron Microscopy UPDATE URL | REPORT BROKEN LINK

Smartech

Popularity:    Hit: 772 | Visit: 14
Details
SMARTech has the ability to generate conventional digital SEM images from 15 to 150,000 times. We can acquire Scanning Electron Microscopy images with either our conventional Everhart and Thornley detector or a solid state backscattered electron detector.

Sponsored Links:


URL:
Title:
Description:

Category:


Related sites
Electron Microscopy Unit, Faculty of Medicine, Lund University, Sweden (Popularity: ): The Laboratory for Electron Microscopy is a central facility of the Pharmaceutical Technology Department. It ...
Bugscope (Popularity: ): Educational outreach project of the World Wide Laboratory. The primary goal of the Bugscope project ...
Simple STM Design Page (Popularity: ): This site features a Simple Scanning Tunneling Microscope (STM) design costing less than $100 to ...
Homebuilt STM Project (Popularity: ): An amateur project to build a scanning tunneling microscope, including detailed descriptions of mechanics, electronics ...
MAC Calibration Standards for SEM TEM BSD BSED STEM (Popularity: ): MAC manufacture standards for the following micro-analysis systems: AUGER, BSED, EDX, SEM, STEM, TEM, WDX, ...
SEM-EDS Laboratory (Popularity: ): Industrial scanning electron microscopy (SEM) and energy dispersive spectrometer (EDS) laboratory in the company Metal ...
M.E. Taylor Engineering (Popularity: ): Provides electron microscopy supplies and equipment and custom machining and laboratory services.
IRC Scanning Probe Microscope Service (Popularity: ): Overview of in-situ STM, AFM/STM equipment, image gallery with links to staff and student vacancies ...
Microanalyst (Popularity: ): Information and forum about microanalysis with X-ray spectrometer (EDX) in Electron Microscope (EPMA)
Microscopy Tips and Tricks (Popularity: ): Help and information on a variety of issues encountered in TEM, SEM and Light Microscopy.

© 2005-2008 Science Central. All Rights Reserved